Trend Reliability Assessment - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

[Book] Development of Junction Technology and Materials for Semiconductor Devices (No. 2372)

[Available for preview] ~ Surface activated bonding, hybrid bonding, Ag·Cu sintering bonding, conductive adhesive ~

Book Title: Development Trends and Reliability Evaluation of Joining Technologies and Materials for Semiconductor Devices －－－－－－－－－－－－－－－－－－－－－ ◎ 3D semiconductors, chiplet integration, SiC power semiconductors, automotive electronic components, microLEDs, etc. This book includes case studies and verification results of new materials and processes aimed at the development of advanced semiconductors! －－－－－－－－－－－－－－－－－－－－－ ■ Key Points of This Book ◎ Joining technologies for miniaturization and heterogeneous integration of advanced semiconductor packages - Application examples of surface-activated bonding in semiconductor device development - Recent development trends and challenges to be addressed in hybrid bonding technology - Surface activation for hybrid bonding and its experimental results - Effectiveness and potential of Cu pillar bonding technology using Ag diffusion bonding - Development of Au-coated Ag bonding wires for the transition to Au-free wire bonding - Principles and mechanisms of ultrasonic bonding and application examples in semiconductor packaging ◎ Joining materials and processes for next-generation power semiconductors to support high-temperature operation - Development of Cu sintering paste and its reliability evaluation - Examination of bonding processes considering the oxidation susceptibility of Cu - Development of new Cu-based solder materials for insulating heat dissipation substrates for power modules